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感測器資訊

 

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Tel : +886-2-2702 5886
Fax : +886-2-2702 6683
Email : Fsc@fedtec.com.tw

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Tel : +886-4-2452 5310
Fax : +886-4-2452 0110
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   傳感器型應變計 

Transducer-Class ® Gages
 
Transducer-Class strain gages are a select group of gage patterns designed specifically for transducer applications. The main objective is optimum gage performance at lower cost in high-volume production quantities.
 
Exclusive features of Transducer-Class gages include:
Optimum backing thickness tolerance This is particularly important to minimize creep variations between gage installations.

Uniform backing trim dimensions Matrix dimensions listed in this bulletin have a tolerance of ±0.005 in (±0.13 mm) on any edge (measured from grid centerlines). On many transducer designs this will allow the gage matrix to be used for gage alignment. Gage placement for bonding can be fixtured more easily for reduced assembly time.

Multiple creep compensation choices for most gage patterns A close inspection of the gage pattern will reveal a small letter on the gage matrix next to the grid. This letter is the creep compensation code. Different creep compensations of the same pattern can be easily identified after removing gages from the package.

Special pattern refinement for improved gage-to-gage reproducibility Creep variation due to operating temperature changes is reduced.
Transducer-Class gages and bondable resistors are available in a wide variety of backing/alloy constructions. (See Gage Designation System for details). The Vishay Measurements Group's Transducer Applications Department can assist you in choosing the series most suitable for your specific requirements.
Gage Series

 
Transducer-Class gages are available in the following combinations of grid alloys and backings:

N2A Open-faced constantan-alloy patterns constructed on a thin, laminated, polyimide-film backing. This series is capable of low and repeatable creep performance. Construction is very rugged,which will help prevent gage handling damage.

J2A Encapsulated constantan-alloy patterns. Both the encapsulation and backing are thin, laminated polyimide film. Gage soldering tabs are exposed for simplified lead connections. Creep performance is equal to the N2A Series, although the presence of an encapsulating layer will require a change in creep code selection to maintain the same performance.

EA Open-faced constantan-alloy patterns with a flexible cast-polyimide backing. Creep scatter is somewhat more pronounced than with all other series. Consequently, EA gages are normally available with only one creep code per pattern.

N2K Open-faced modified-Karma-alloy patterns constructed on a thin, laminated, polyimide-film backing. More rugged and flexible than the TK or SK Series, N2K gages are popular for transducer applications where lower cost K-alloy gages are desired. All N2K gages are supplied with copper soldering pads (DP) for ease of leadwire attachment. Most gages in the N2K Series can also be modulus compensated.

N3K Special, open-faced, modified-Karma-alloy patterns constructed on an ultrathin, laminated polyimide-film backing. Their small size and high resistance (5000 ohms) makes them ideally suited for 4 to 20 mA process control transmitters and battery-operated systems. All N3K gages are supplied with a copper soldering pad (DP) on each gage tab.

TK Open-faced modified-Karma-alloy patterns with a thin, reinforced, laminate backing. These gages have a higher operating temperature range and greater fatigue life than N2A , J2A , EA , N2K , or N3K gages. However, they are generally more costly. Most gages in the TK Series can also be modulus compensated. All TK gages are supplied with a copper soldering pad (DP) on each gage tab.

SK Fully encapsulated, modified-Karma-alloy patterns with a preformed solder dot on each gage tab. Both backing and encapsulation are thin, reinforced, laminated material. Due to the relatively stiff backing and encapsulation, SK-Series gages are less flexible than all other series and care must be exercised in handling and bonding. Some SK patterns can be supplied with modulus compensation (EMC) options.

J5K Encapsulated, modified-Karma-alloy patterns specially constructed to improve gage performance at elevated temperatures. Because of the laminated polyimide-film backing and encapsulation, all J5K patterns are fully flexible without being brittle. Copper soldering pads (DP) are exposed for simplified lead connections. Some J5K gages can be supplied with modulus compensation (EMC) options. For best high-temperature performance, J5K-Series gages should be installed with M-Bond 450 high-temperature adhesive.

J5E A family of platinum-tungsten-alloy patterns constructed with a thin, flexible polyimide backing. Sensing grids are fully encapsulated by a polyimide film overlay and include a preformed solder dot on each gage tab. With a gage factor more than double that of conventional strain gages, platinum-tungsten-alloy patterns provide standard transducer output levels at less than half the normal spring-element stress values. This allows for higher overload safety, increased fatigue life, and improved linearity in many transducer designs. A negative gage-factor-versus-temperature slope also provides modulus compensation in many types of steel transducer spring elements. A relatively high thermal output of platinum-tungsten alloy makes precision static measurements difficult.

 

Transducer-class Gages

Linear Patterns 單軸向應變計

   Single Grid (1)
    Dual Grid (1)
90 ° Patterns (1)

Shear Patterns剪力型應變計

 Single Grid (1)
    Dual Grid (1)
High Resistance Patterns (1)
Full Bridge Patterns (1) 

Diaphragm Patterns 特殊狀應變計

   Circular (1)
    Linear (1)
Platinum-Tungsten Patterns (1)

 

    應變計相關技術文件   Knowledge Bases      

應變規快速挑選型錄 (pdf)

應變規之介紹與應用 (pdf)

應變規產品全型錄下載 (pdf)

殘留應力應變計型錄下載 (pdf)

Strain Gage Knowledge Base

The Strain Gage Knowledge Base is a compendium of technical information related to the application of Vishay Micro-Measurements strain gages, installation accessories and instruments in the making of precision strain measurements.

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PhotoStress Knowledge Base

The PhotoStress Knowledge Base is a compendium of technical information related to use of the Vishay Micro-Measurements PhotoStress Plus system for optical measurement and analysis of stresses/strains in test parts and structures.

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